Development of optical sensors and image sensors

We offer:

• Design and development of application-specific image sensors, e.g. multi-aperture image sensors and sensors with special pixel arrangements
• Characterization of multi-aperture image sensors

Applications

• Ultra-flat cameras, e.g. in smartphones, tablets, notebooks, VR glasses
• Object recognition in automotive area
• Multi-aperturesystems for post processing image correction (refocusing, crop imaging, cutting out)
• Machine Vision in Industry 4.0

We offer:

• Development of customized and application specific Time-of-Flight (ToF)-image sensors
• Characterization of ToF-sensors

Applications

• Driver assistance systems in automotive area
• Robotics in Industry 4.0

We operate several measuring stations both for our own sensors and for our customers’ sensors.

Photodiodes and optical sensors:

• Measurement of sensitivity and linearity (A/W) in relation to wavelength (200 nm – 1100 nm)
• Measurement of sensitivity in relation to polarization and determination of polarization contrast
• All measurements can be made relative to the angle of incidence of the light and at various temperatures

Image sensors and pixels:

• Measurement of sensitivity (quantum efficiency) and linearity in relation to wavelength 
  (200 nm – 1100 nm) in monochrome cameras, color cameras and multispectral cameras
• Measurement of sensitivity in relation to polarization and determination of polarization contrast in polarization image sensors and cameras
• Illumination and characterization of individual pixels: Measurement of the above variables and of crosstalk in relation to frequency
• Measurements can be conducted in accordance with the EMVA 1288 standard
• Pixel characterization can be performed for various angles of incidence