Fraunhofer Institute for Integrated Circuits IIS
Fraunhofer Institute for Integrated Circuits IIS

Development of optical sensors and image sensors

In the field of optical sensors we develop application-specific optical sensors and sensor systems. The sensors can be designed as individual sensors or as line or image sensors and feature integrated signal processing and interfaces. They are produced using CMOS technology and can be manufactured cost-effectively in high volume.

Thereby we support our customers with the entire development process, from feasibility study up to market readiness.

For more information on our technology, click here.

Our range of services includes:

Expand all Close all

Development of multispectral- and polarisation sensors

We offer:

  • Simulation of optical nanostructures that act as spectral filters
  • Design of photodiode arrays and image sensors
  • Production process for integrated sensors
  • Electrical and optical characterization
  • System design for applications, e.g. LED control and analysis
To capture the spectral characteristics of light, we use photodiodes and optical nanostructures in the metal layers of CMOS processes.
The number of photodiodes and pixels as well as the geometry can be adapted to customer needs.

 

Applications:

  • Analysis of gases and liquids
  • LED monitoring and control for human centric lighting
  • Machine vision for quality control, sorting and smart farming
  • Driver assistance systems in the automotive sector
Further information you will find in our flyer.

Development of application specific image sensors

We offer:

  • Design and development of application-specific image sensors, e.g. multi-aperture image sensors and sensors with special pixel arrangements
  • Characterization of multi-aperture image sensors
Working together with our commercial manufacturing partners and their established opto-CMOS processes, we develop more than standard image sensors. Compared to conventional camera designs, this permits a 50% reduction in installation size (height) for the camera module.

 

Applications

  • Ultra-flat cameras, e.g. in smartphones, tablets, notebooks, VR glasses
  • Object recognition in automotive area
  • Multi-aperturesystems for post processing image correction (refocusing, crop imaging, cutting out)
  • Machine Vision in Industry 4.0
Further information you will find in our flyer.
These multi-aperture image sensors are being developed in the facetvision project.
 

Development of sensors for time-of-flight measurements of light

We offer:

  • Development of customized and application specific Time-of-Flight (ToF)-image sensors
  • Characterization of ToF-sensors
Frequently, LiDAR technology (Light Detection and Ranging) is used for distance measurements and environment monitoring. Thereby it is possible to measure the distance and velocity of objects in real time.

 

Applications

  • Driver assistance systems in automotive area
  • Robotics in Industry 4.0

Characterization of optical sensors and image sensors

We operate several measuring stations both for our own sensors and for our customers’ sensors.

Photodiodes and optical sensors:

  • Measurement of sensitivity and linearity (A/W) in relation to wavelength (200 nm – 1100 nm)
  • Measurement of sensitivity in relation to polarization and determination of polarization contrast
  • All measurements can be made relative to the angle of incidence of the light and at various temperatures
 

Image sensors and pixels:

  • Measurement of sensitivity (quantum efficiency) and linearity in relation to wavelength 
    (200 nm – 1100 nm) in monochrome cameras, color cameras and multispectral cameras
  • Measurement of sensitivity in relation to polarization and determination of polarization contrast in polarization image sensors and cameras
  • Illumination and characterization of individual pixels: Measurement of the above variables and of crosstalk in relation to frequency
  • Measurements can be conducted in accordance with the EMVA 1288 standard
  • Pixel characterization can be performed for various angles of incidence

 

 

© Fraunhofer IIS/Max Etzold


Application specific
image sensors

more information

Related links: