For queries about the anniversary of the X-ray or technical questions about X-ray technology, Fraunhofer IIS has a range of experts at various locations:
Fürth:
Prof. Randolf Hanke
Specialist field: industrial X-ray technology; special focus: cognitive sensor systems
+49 911 58061-7510
randolf.hanke@iis.fraunhofer.de
Dr. Norman Uhlmann
Specialist field: industrial X-ray technology, special focus: XXL computed tomography
+49 911 58061-7560
norman.uhlmann@iis.fraunhofer.de
Dr. Steven Oeckl
Specialist field: industrial X-ray technology, special focus: production monitoring
+49 911 58061-7544
steven.oeckl@iis.fraunhofer.de
Michael Salamon
Specialist field: industrial X-ray technology, special focus: special systems and XXL computed tomography
+49 911 58061-7562
michael.salamon@iis.fraunhofer.de
Dr. Theobald Fuchs
Specialist field: industrial X-ray technology, X-ray physics and history of X-ray technology
+49 911 58061-7513
theobald.fuchs@iis.fraunhofer.de
Würzburg:
Prof. Randolf Hanke
Specialist field: industrial X-ray technology, special focus: X-ray microscopy
+49 931 31-83289
randolf.hanke@physik.uni-wuerzburg.de
Dr. Simon Zabler
Specialist field: industrial X-ray technology, Special focus: high-resolution X-ray systems
+49 931 31-86261
simon.zabler@iis.fraunhofer.de
Saarbrücken:
Prof. Randolf Hanke
Specialist field: industrial X-ray technology, special focus: non-destructive material testing
+49 681 9302-3811
randolf.hanke@izfp.fraunhofer.de
Deggendorf:
Prof. Jochen Hiller
Specialist field: industrial X-ray technology, special focus: non-destructive monitoring in trade
+49 991 3615-375
jochen.hiller@iis.fraunhofer.de
Passau:
Prof. Tomas Sauer
Specialist field: knowledge-based image processing; special focus: processing large 3D data sets
+49 851 509-3100
tomas.sauer@iis.fraunhofer.de